What's New in 2011–2012?

Basic Skills Test Being Replaced with the ICTS Test of Academic Proficiency
Registration opens January 31, 2012

Computer-based testing for the ICTS Basic Skills test (300) will no longer be available after the December 8–21, 2011, testing window. Any examinees who have completed registrations for the Basic Skills test on computer for tests not taken by December 21, 2011, will be contacted by Customer Service with further instructions.

Beginning on February 1, 2012, the Basic Skills test on computer will be replaced with the ICTS Test of Academic Proficiency (400). The Test of Academic Proficiency (TAP) will be administered only as a computer-based test, and registration will open in early 2012. The Basic Skills test will continue to be administered at the January, February, and April 2012 paper-based test administrations only. Any examinees who have completed registrations to take the Basic Skills test at either the June 2, 2012, or July 7, 2012, paper-based test administrations will be contacted with further instructions by Customer Service.

The Test of Academic Proficiency (TAP) consists of the following subtests:

Registration and fees. Examinees taking the Test of Academic Proficiency will have the opportunity to register for all four subtests in one test session or for each subtest independently. The total fee for registering for all four subtests is $125, and the total fee for registering for one subtest is $75. Examinees will not be required to complete subtests they have already passed.

Passing the test. If an examinee has previously passed one or more Basic Skills (300) subtests, the passing score(s) will count toward the passing of the Test of Academic Proficiency. However, test scores from the previous ICTS Basic Skills test model (096) (administered prior to September 11, 2010) cannot be applied to fulfill passing requirements.

Each attempt of one or more Test of Academic Proficiency subtests counts toward the ICTS Test Attempt Limit Policy of five attempts per test. However, previous Basic Skills attempts do not count toward Test of Academic Proficiency attempts, even if an examinee passed one or more Basic Skills subtests, and those scores are being applied to the Test of Academic Proficiency.

Scores for the Test of Academic Proficiency will be delayed until spring 2012 while ISBE establishes a passing score for the test.

Preparation Materials

In addition to a study guide, the following materials will be available in January 2012 for examinees preparing for the TAP:

Interactive practice test. $17.95 for individual practice tests, $29.95 for the bundle of all three practice tests (Reading Comprehension, Language Arts/Writing, and Mathematics). The practice test includes:

Expanded study guide. $19.95. The expanded study guide features instructional content and review exercises. The expanded study guide includes:

New Computer-Based Testing Retake Policy

Tests before January 17, 2012. If you test before January 17, 2012, you must wait 120 days after taking a computer-based ICTS test before retaking the same test on computer.

Tests on or after January 17, 2012. If you test on or after January 17, 2012, you must wait 60 days after taking a computer-based ICTS test before retaking the same test on computer.

See "Retake Policy" for more information about retaking an ICTS test.

New Tests Available on Computer

English Language Arts and Mathematics are now available on computer. Registration is now open, and these tests will begin to be administered on February 27, 2012. See "Computer-Based Testing" for more information.

On-Demand Computer-Based Testing

As of February 27, 2012, all computer-based ICTS tests will be offered by appointment, year round. Test appointments are available on a first-come, first-served basis. See "Test Dates" for more information.

New Target Language Proficiency Tests

Target Language Proficiency tests for the following languages are now available. Registration is now open, and these tests are offered at the February and July 2012 test administrations. See "Test Selection" for more information.